Publication | Closed Access
X ray absorption spectroscopy investigation of phase transition in Ge, GaAs and GaP
19
Citations
6
References
1990
Year
SemiconductorsMaterials ScienceIi-vi SemiconductorX-ray SpectroscopyEngineeringPhysicsX-ray DiffractionApplied PhysicsCondensed Matter PhysicsX-ray AbsorptionPressure ReleaseSemiconductor MaterialX-ray Free-electron LaserCrystallographyHigh Pressure Phase
Abstract The phase transitions of GaAs, GaP and Ge under pressure have been investigated by x-ray absorption spectroscopy (XAS). At the onset of the transition the Debye-Waller factor increases and the x-ray absorption near edge structure (XANES) is progressively modified. A mixing of the low and high pressure phase can be determined by XAS as well as amorphization of the sample on pressure release.
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