Publication | Open Access
Intrinsic Ferroelectric Properties of Strained Tetragonal PbZr<sub>0.2</sub>Ti<sub>0.8</sub>O<sub>3</sub> Obtained on Layer–by–Layer Grown, Defect–Free Single–Crystalline Films
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Citations
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References
2006
Year
Layer–by–layer GrownOptical MaterialsEngineeringPiezoelectric CoefficientVicinal Srtio3MultiferroicsIntrinsic Ferroelectric PropertiesFerroelectric ApplicationQuantum MaterialsPiezoelectric MaterialDefect–free Single–crystalline FilmsMaterials ScienceCrystalline DefectsRemnant PolarizationSemiconductor MaterialCondensed Matter PhysicsApplied PhysicsFerroelectric MaterialsThin Films
Ferroelectric single–crystalline PbZr0.2Ti0.8O3 thin films, free from extended defects, are grown by pulsed laser deposition onto vicinal SrTiO3(001) single crystals. The PbZr0.2Ti0.8O3 films are strained and exhibit enhanced tetragonality, c/a ≈ 1.06. They have a remnant polarization, Pr ≈ 110 μC cm–2, dielectric constant, ϵ33 ≈ 90, and piezoelectric coefficient, d33, up to 50 pm V–1 (see figure).
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