Diffuse wall structure and narrow mesopores in highly crystalline MCM-41 materials studied by X-ray diffraction

Abstract

Synchrotron X-ray diffraction patterns for highly crystalline MCM-41 a mesoporous silicate molecular sieve are presented. The form factor observed in seven orders of diffraction is used to show the existence of a two-layer wall structure, with a narrower mesopore than previously assumed, and much void space in the walls.