Sub-Nanoampere One-Shot Single Electron Transistor Readout Electrometry Below 10 Kelvin

Abstract

The Single Electron Transistor holds the potential to be a suitable readout device for future solid-state quantum computers. The low temperature measurement results of a 0.5 μm Silicon-On-Sapphire CMOS circuit designed to interface with a Single Electron Transistor are presented. Careful design of the experimental set-up is critical for conducting the circuit test and performance measurements at cryogenic temperatures. The circuit operates at 4 K and achieves single-shot readout with a resolution in the order of one nanoampere. A detection delay as low as 1.5 μs is recorded while dissipating only 20-30 μW power.