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Annealing effect on surface passivation of a-Si:H/c-Si interface in terms of crystalline volume fraction

Materials ScienceCrystalline Volume FractionEngineeringNanoelectronicsSurface ScienceApplied PhysicsSiliceneSurface PassivationSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsH/c-si InterfaceSemiconductor Device