Total internal reflection holographic recording in very thin films

Abstract

We present a theoretical background and experimental verification of holographic recording in nano-sized films. The interference pattern is created by a total internal reflected (TIR) reference wave and normally incident plane one. Due to a surface-propagating evanescent wave, the holographic recording is stored in 39 nm arsenic trisulfide film. The exposure and modulation dependence on the diffraction efficiency is investigated. The angular and wavelength selectivity of the thin TIR hologram is shown to be similar to that of thick Bragg gratings.