Publication | Closed Access
Thermal behavior of residual strain in silicon-on-insulator bonded wafer and effects on electron mobility
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Citations
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References
1999
Year
Materials ScienceElectrical EngineeringWafer Scale ProcessingEngineeringSemiconductor DeviceApplied PhysicsThermal BehaviorResidual StrainSemiconductor Device FabricationElectron MobilityElectronic PackagingSilicon On InsulatorElectrical Insulation
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