Concepedia

Non-destructive thickness measurement of dichromated gelatin films deposited on glass plates

R. P. Shukla, D. V. Udupa, N. C. Das, Murty V. Mantravadi

Optics & Laser Technology · 2005 · 18 citations · 8 references

DOI

Concepts

References

8

Optical interference method for the approximate determination of refractive index and thickness of a transparent layer

Alvin M. Goodman · Applied Optics · 1978 · 195 citations

, , +16

Multiple-Beam Interference Microscopy of Metals

Peter H. Bartels, S. Tolansky · Transactions of the American Microscopical Society · 1971 · 195 citations

, , +10

Analytical procedure for determining lengths from fractional fringes

C. R. Tilford · Applied Optics · 1977 · 118 citations

, , +12

Absolute distance measurements by CO_2 laser multiwavelength interferometry

Gilbert L. Bourdet, A. Orszag · Applied Optics · 1979 · 53 citations

, , +17

An Interferometric Method for Accurate Thickness Measurements of Thin Evaporated Films

L. G. Schulz · Journal of the Optical Society of America · 1950 · 13 citations

, , +11