Publication | Open Access

A Polarization Modulation Infrared Reflection Technique Applied to Study of Thin Films on Metal and Semiconductor Surfaces

Materials ScienceSurface CharacterizationEngineeringOptical PropertiesSurface AnalysisSurface ScienceApplied PhysicsSemiconductor SurfacesThin FilmsDepth-graded Multilayer CoatingThin Film Processing