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Microstructure of an artificial grain boundary weak link in an YBa2Cu3O7−σ thin film grown on a (100)(110), [001]-tilt Y-ZrO2 bicrystal

Materials ScienceMaterial AnalysisEngineeringCrystalline DefectsCrystal Growth TechnologyOxide ElectronicsCondensed Matter PhysicsSuperconductivityApplied PhysicsYba2cu3o7−σ Thin FilmThin Film Process TechnologyThin FilmsEpitaxial GrowthCrystallography