Publication | Closed Access
Study of structure and optical properties of silver oxide films by ellipsometry, XRD and XPS methods
219
Citations
7
References
2004
Year
Materials ScienceSurface CharacterizationOptical MaterialsEngineeringNanomaterialsOptical PropertiesOxide ElectronicsSurface ScienceApplied PhysicsThin Film ProcessingXps Methods
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