Presence of mobility-fluctuation noise identified in silicon P+NP transistors - Concepedia

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Presence of mobility-fluctuation noise identified in silicon P+NP transistors

54

Citations

5

References

1983

Year

J. Kilmer, A. van der Ziel, G. Bosman

Solid-State Electronics

Electrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityApplied PhysicsNoiseMicroelectronicsSilicon P+np TransistorsSemiconductor Device

References

	Year	Citations

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