X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset

Rui Deng, Bin Yao, Yongfeng Li, Yan Zhao, B. H. Li, C. X. Shan, Z. Z. Zhang, Dong Zhao, J. Y. Zhang, Dazhong Shen,

Applied Physics Letters · 2009 · 105 citations · 27 references

Concepts

Abstract

Valence-band offset (VBO) of n-ZnO/p-NiO heterojunction has been investigated by x-ray photoelectron spectroscopy. Core levels of Zn 2p and Ni 2p were used to align the VBO of n-ZnO/p-NiO heterojunction. It was found that n-ZnO/p-NiO heterojunction has a type-II band alignment and its VBO is determined to be 2.60±0.20 eV, and conduction-band offset is deduced to be 2.93±0.20 eV. The experimental VBO value is in good agreement with the calculated value based on the electron affinity of ZnO and NiO.

References

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