Publication | Open Access

Electromigration occurences and its effects on metallic surfaces submitted to high electromagnetic field: A novel approach to breakdown in accelerators

Accelerator TechnologyElectrical EngineeringElectromigration TechniqueEngineeringPhysicsHigh Electromagnetic FieldApplied PhysicsTime-dependent Dielectric BreakdownMetallic SurfacesAccelerator PhysicElectronic PackagingParticle AcceleratorMicroelectronicsElectromigration OccurencesElectrical InsulationElectromagnetic Compatibility