Concepedia

Extraction of topographic and material contrasts on surfaces from SEM images obtained by energy filtering detection with low-energy primary electrons

Masayasu Nagoshi, Tomohiro Aoyama, Kaoru Sato

Ultramicroscopy · 2012 · 23 citations · 7 references

DOI

Concepts

References

7

Sharing of secondary electrons by in-lens and out-lens detector in low-voltage scanning electron microscope equipped with immersion lens

Kazuhiro Kumagai, Takashi Sekiguchi · Ultramicroscopy · 2009 · 56 citations

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Information depth and spatial resolution in BSE microtomography in SEM

Heinz Niedrig · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1998 · 48 citations

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About the role of the various types of secondary electrons (SE<sub>1</sub>; SE<sub>2</sub>; SE<sub>3</sub>) on the performance of LVSEM

J. Cazaux · Journal of Microscopy · 2004 · 37 citations

, , +12

Selective Backscattered Electron Imaging of Material and Channeling Contrast in Microstructures of Scale on Low Carbon Steel Controlled by Accelerating Voltage and Take-off Angle

Tomohiro Aoyama, Masayasu Nagoshi, Hideki Nagano et al. · ISIJ International · 2011 · 33 citations · Full text

, , +11

A high signal-to-noise ratio toroidal electron spectrometer for the SEM

Hung Quang Hoang, Mans Osterberg, Anjam Khursheed · Ultramicroscopy · 2011 · 19 citations

, , +9