Dielectric measurements and domain structure in LiKSO₄at low temperatures

Abstract

Dielectric measurements in the temperature range 33-300K with simultaneous optical observations on LiKSO 4 slabs perpendicular to the c hexagonal axis have been performed. A few dielectric anomalies and domain textures are obtained according to the different thermal treatments. A specific thermal treatment has been found allowing reproducible results. Previous contradictory results in the literature can therefore be explained.