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Surface Acoustic Wave Velocity and Electromechanical Coupling Coefficient of GaN Grown on (0001) Sapphire by Metal-Organic Vapour Phase Epitaxy
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Citations
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References
2001
Year
Materials EngineeringMaterials ScienceElectrical EngineeringWide-bandgap SemiconductorEngineeringElectromechanical Coupling CoefficientAluminium NitrideNanoelectronicsSurface ScienceApplied PhysicsGan SurfaceAluminum Gallium NitrideSapphire FaceGan Power DeviceHigh-resistivity Gan FilmsGan GrownMicroelectronicsCategoryiii-v Semiconductor
High-quality and high-resistivity GaN films were grown on (0001) sapphire face by metal-organic vapour phase epitaxy. To measure the surface acoustic wave properties accurately, we deposited metallized interdigital transducers on the GaN surface. The acoustic surface wave velocity and electromechanical coupling coefficient were measured, respectively, to be 5667 m/s and 1.9% by the pulse method.
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