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Analyses and design of bias circuits tolerating output voltages above BV/sub CEO/
42
Citations
10
References
2005
Year
Electrical EngineeringEngineeringCircuit SystemPower CircuitElectronic EngineeringBias CircuitsPower Semiconductor DeviceComputer EngineeringInevitable TradeoffBv/sub Ceo/Output VoltagesPower ElectronicsOutput Breakdown VoltageMicroelectronicsBreakdown VoltageElectronic Circuit
Due to the inevitable tradeoff between speed and breakdown voltage, the spectacular speed improvement of modern SiGe processes in recent history has partially been achieved at the cost of a reduction in breakdown voltages. Because supply voltages have hardly been reduced however, circuits operating at a supply voltage above the collector-emitter breakdown voltage (BV/sub CEO/) are common practice today and collector-base avalanche currents are therefore of major concern. Transistors that need to handle a collector-emitter voltage above (BV/sub CEO/) are typically found as output transistors in output driver stages and in bias current circuits. Such circuits can be designed to tolerate collector-emitter voltages above (BV/sub CEO/) by driving the base terminal with a relatively low impedance. This paper analyzes various conventional as well as two new bias current circuits supporting operation at collector voltages above (BV/sub CEO/). In the new circuits, feedforward and feedback avalanche current compensation techniques are introduced that obtain a substantial increase in output breakdown voltage of the bias circuits and improve the accuracy of the current mirror at output voltages above (BV/sub CEO/). With the feedback technique, a measured increase in output breakdown voltage by more than 2 V is demonstrated while the accuracy of the current mirror ratio at output voltages of 2 to 3 times (BV/sub CEO/) is improved by an order of magnitude.
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