Transmission electron microscopy and x-ray structural investigation of La<sub>0.7</sub>Ca<sub>0.3</sub>MnO<sub>3</sub> thin films - Concepedia

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Transmission electron microscopy and x-ray structural investigation of La<sub>0.7</sub>Ca<sub>0.3</sub>MnO<sub>3</sub> thin films

35

Citations

19

References

1998

Year

Y. H. Li, K. A. Thomas, P. S. I. P. N. de Silva, L. F. Cohen, Ankit Goyal, M. Rajeswari, N. D. Mathur, M. G. Blamire, J. E. Evetts, T. Venkatesan,

Journal of materials research/Pratt's guide to venture capital sources

Materials ScienceMaterial AnalysisEngineeringTransmission Electron MicroscopyX-ray DiffractionApplied PhysicsCondensed Matter PhysicsX-ray Structural InvestigationThin Film Process TechnologyThin FilmsCrystallographyThin Film Processing

References

	Year	Citations

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