Non-destructive structural analysis of surface blistering by TEM and EELS in a reflection configuration - Concepedia

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Non-destructive structural analysis of surface blistering by TEM and EELS in a reflection configuration

23

Citations

4

References

2001

Year

Shunsuke Muto, T. Matsui, Takehiko Tanabe

Journal of Nuclear Materials

Materials ScienceSurface CharacterizationEngineeringSurface AnalysisSurface ScienceApplied PhysicsNon-destructive Structural AnalysisSurface TreatmentSurface ProcessingReflection ConfigurationSurface Blistering

References

	Year	Citations

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