Inelastic electron tunneling spectroscopy on MOS structures with very thin oxide films - Concepedia

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Inelastic electron tunneling spectroscopy on MOS structures with very thin oxide films

13

Citations

15

References

1985

Year

H.‐G. Busmann, S. Ewert, Wolfram Sander, K. Seibert, P. Balk, A. Steffen

The European Physical Journal B

Materials ScienceEngineeringTunneling MicroscopyPhysicsOxide ElectronicsApplied PhysicsCondensed Matter PhysicsMos StructuresMultilayer HeterostructuresInelastic Electron

References

	Year	Citations

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