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Ellipsometry investigation of the effects of annealing temperature on the optical properties of indium tin oxide thin films studied by Drude–Lorentz model

Materials ScienceThin Film PhysicsOptical MaterialsEngineeringOptical PropertiesOxide ElectronicsApplied PhysicsOptoelectronic DevicesEllipsometry InvestigationThin Film Process TechnologyThin FilmsDrude–lorentz ModelThin Film Processing