Precipitates with a Defect Structure in Thin Film of NiO

Abstract

Thin films of single crystal of NiO are prepared by the method initiated by Cech and Alessandrini. The films are heated at 1400∼1600°C in air and are examined by means of electron microscopy and electron diffraction. Many coherent particles of a second phase with characteristic shapes appear in the matrix film of NiO. They have a defect structure of Ni-deficient NiO, which is of spinel-type. Growth and morphology of the precipitates are observed and discussed.