X-Ray diffraction study of carriers and deposited metallic catalysts

Abstract

The possibilities of applying some X-ray diffraction methods in the study of multicomponent highly disperse systems are examined. Such methods include the method based on the radial distribution of atoms (RDA), full-profile X-ray diffraction analysis (FPA), and the method involving the determination of substructural characteristics (MDSC). Examples of the determination of the structural and substructural characteristics of the most important catalyst carriers as well as deposited and non-deposited metallic catalysts are presented. The bibliography includes 129 references.