A Method for Combinatorial Fabrication and Characterization of Organic/Inorganic Thin Film Devices in UHV

Abstract

ADVERTISEMENT RETURN TO ISSUEReportNEXTA Method for Combinatorial Fabrication and Characterization of Organic/Inorganic Thin Film Devices in UHVStefan Egger, Seiji Higuchi, and Tomonobu NakayamaView Author Information International Center for Young Scientists and Nanomaterials Laboratory, National Institute for Materials Science, Tsukuba, Japan, and Graduate School of Applied and Pure Sciences, University of Tsukuba, Tsukuba, Japan Cite this: J. Comb. Chem. 2006, 8, 3, 275–279Publication Date (Web):April 22, 2006Publication History Received22 December 2005Published online22 April 2006Published inissue 1 May 2006https://pubs.acs.org/doi/10.1021/cc0501662https://doi.org/10.1021/cc0501662brief-reportACS PublicationsCopyright © 2006 American Chemical SocietyRequest reuse permissionsArticle Views269Altmetric-Citations14LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access options SUBJECTS:Chemical structure,Electrodes,Interfaces,Layers,Thickness Get e-Alerts