Publication | Closed Access
An in situ study of mesostructured CTAB-silica film formation using infrared ellipsometry: evolution of water content
12
Citations
10
References
2004
Year
Materials ScienceMolecular SieveSurface CharacterizationMaterial AnalysisEngineeringInfrared EllipsometrySitu StudySurface AnalysisSurface ScienceChemistryWater ContentThin Film Processing
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