Publication | Closed Access
Z-scan measurements of the anisotropy of nonlinear refraction and absorption in crystals
181
Citations
13
References
1993
Year
EngineeringNonlinear OpticsWave PlateOptical PropertiesOptical SpectroscopyZ-scan ApparatusAnisotropic MaterialMaterials SciencePhotonicsPhysicsCrystal MaterialNon-linear OpticZ-scan MeasurementsNonlinear CrystalsCrystallographyApplied PhysicsCondensed Matter PhysicsCrystalsOptoelectronicsNonlinear Refraction
We introduce a method for measuring the anisotropy of nonlinear absorption and nonlinear refraction in crystals by incorporating a wave plate into the Z-scan apparatus. We demonstrate this method by measuring the polarization dependence of the nonlinear refractive index or two-photon absorption coefficient in BaF2, KTP, and GaAs at wavelengths of 532 and 1064 nm.
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