The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps

Abstract

This paper contains the results of the detailed simulation study of the role of ion-enhanced field emission on the breakdown voltage in argon, xenon and krypton at high frequencies. Calculations were performed by using a one-dimensional particle-in-cell/Monte Carlo collisions (PIC/MCC) code with the secondary emission model adjusted to include field emission effects in microgaps. The obtained simulation results clearly show that electrical breakdown across micron-size gaps may occur at voltages far below the minimum predicted by the conventional Paschen curve. The observed breakdown voltage reduction may be attributed to the onset of ion-enhanced field emission.