X-ray Berg–Barrett topography of the deformation substructure of stabilized zirconium oxide single crystals deformed at 1673 K

Abstract

X-ray Berg–Barrett topography has been used to check the nature of the slip systems that are activated during high-temperature plastic deformation of single crystals and to follow the evolution of the microstructure with the strain. A study has been made of yttria fully stabilized zirconium oxide deformed by compression along the 〈001〉 direction at 1673 K. The {110} 〈1{\bar 1}0〉 slip system was activated.