Publication | Closed Access
The ‘defected layer’ and the mechanism of the interface-related metastable behavior in the ZnO/CdS/Cu(In,Ga)Se2 devices
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Citations
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References
2003
Year
SemiconductorsElectrical EngineeringEngineeringCrystalline DefectsOxide ElectronicsApplied PhysicsCondensed Matter PhysicsSemiconductor NanostructuresSemiconductor MaterialSe2 DevicesInterface-related Metastable BehaviorLayer ’
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