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Oscillatory Interlayer Exchange Coupling with the Cu Cap Layer Thickness in Co/Cu/Co/Cu(100)
64
Citations
12
References
1995
Year
EngineeringInterconnect (Integrated Circuits)MagnetismInterface ChemistryNanoelectronicsSuperconductivityHigh Tc SuperconductorsOscillatory DependenceMaterials SciencePhysicsCap LayerCap Layer ThicknessSolid-state PhysicInterface PropertySpintronicsSurface ScienceApplied PhysicsCondensed Matter PhysicsInterfacial StudyInterface Phenomenon
An oscillatory dependence of the strength of the antiferromagnetic exchange coupling on the cap layer thickness has been observed in an epitaxial Co/Cu/Co/Cu(100) sample with a wedge-shaped Cu interlayer and cap layer. The result is consistent with a single long oscillation period stemming from the extremal spanning vector of the Cu (cap layer) Fermi surface along the $\ensuremath{\Gamma}X$ line. The absence of a short period oscillation is understood from the confinement of the corresponding electron states to the spacer. A quantitative comparison with Bruno's model is made.
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