Publication | Open Access
Comparison of structure and properties of femtosecond and nanosecond laser-structured silicon
398
Citations
9
References
2004
Year
Optical MaterialsEngineeringSilicon MicrostructuresChemical CompositionLaser ApplicationsLaser MaterialNanosecond Laser-structured SiliconSilicon On InsulatorSemiconductorsOptical PropertiesNanophotonicsUltrafast LasersMaterials SciencePhotonicsPhysicsCrystalline DefectsNanotechnologyOptoelectronic MaterialsPhotonic MaterialsLaser Processing TechnologyLaser-assisted DepositionFemtosecond Laser IrradiationAdvanced Laser ProcessingApplied PhysicsLaser-surface Interactions
We compare the optical properties, chemical composition, and crystallinity of silicon microstructures formed in the presence of SF6 by femtosecond laser irradiation and by nanosecond laser irradiation. In spite of very different morphology and crystallinity, the optical properties and chemical composition of the two types of microstructures are very similar. The structures formed with femtosecond (fs) pulses are covered with a disordered nanocrystalline surface layer less than 1 μm thick, while those formed with nanosecond (ns) pulses have very little disorder. Both ns-laser-formed and fs-laser-formed structures absorb near-infrared (1.1–2.5 μm) radiation strongly and have roughly 0.5% sulfur impurities.
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