Publication | Closed Access
Surface-Effect Characteristics of Photoemission from Clean Copper-Crystal Surfaces
35
Citations
5
References
1973
Year
Optical MaterialsEngineeringSurface ProcessingSurface Photoelectric EffectPhotoelectric SensorElectron SpectroscopyOptical PropertiesNormal IncidenceNanophotonicsMaterials SciencePhotonicsPhotoluminescencePhysicsPhotoelectric MeasurementClean Copper-crystal SurfacesSurface CharacterizationCopper Oxide MaterialsSurface AnalysisSurface ScienceApplied PhysicsPhoton EnergiesOptoelectronics
With photon energies within 1.5 eV above the threshold, photoelectric yields, as measured from Cu (100) and (111) with obliquely incident light, exhibit strong deviations from the $Y\ensuremath{\propto}{(\ensuremath{\hbar}\ensuremath{\omega}\ensuremath{-}\ensuremath{\phi})}^{2}$ dependence found at normal incidence. A preliminary energy analysis shows the distribution of the emitted electrons to shift towards the high-energy edge when the angle of incidence changes from 0\ifmmode^\circ\else\textdegree\fi{} to 60\ifmmode^\circ\else\textdegree\fi{}. The results are interpreted in terms of a surface photoelectric effect.
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