Crystal Growth & Design · 2010 · 42 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceInorganic ChemistrySolid-state ChemistryThin FilmsCrystal PlanesEpitaxial GrowthPerovskite MaterialsThin Film AnnealingThin Film OxidationThin-film MaterialsAnnealingAnnealing EffectsEpitaxial Film GrowthEpitaxial Film MorphologyEpitaxial Thin FilmsEpitaxial Thin-film GrowthX-ray Absorption SpectroscopyX-ray Diffraction Analysis
Low-temperature annealing with CaH 2 reduced a perovskite LaNiO 3 thin film to a c -axis oriented LaNiO 2 thin film with an infinite-layer structure. X-ray diffraction and X-ray absorption spectroscopy measurements revealed that a further annealing caused oxygen rearrangement that changed the c -axis oriented LaNiO 2 to an a -axis oriented LaNiO 2 thin film consisting of a twin structure without changing the monovalent Ni oxidation state. The NiO 2 infinite-layer planes in the a -axis oriented and c -axis oriented LaNiO 2 thin films are perpendicular to each other.
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The parent structure of the layered high-temperature superconductors
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