Surface and Interface Analysis · 2001 · 19 citations · 16 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationMetallic MaterialsMetallurgyAlloysMetal MaterialsMetalsNanomaterial CharacterizationSurface CharacterizationSurface CrystallographyAlloyingAluminium AlloysAluminum AlloysAluminum-containing AlloysCopper AlloysMetallic NanomaterialsMetallic Nanostructures
Abstract The topmost 20 nm of an electropolished Al–1 at.% Cu alloy has been investigated at sub‐nanometre resolution using medium‐energy ion scattering. Differences in the composition and depth of the enriched Cu layer are observed. Most significantly, the enriched layer contains regions of differing structure and/or lattice orientation with Cu atoms located in distinct ordered regions, consistent with the presence of Cu‐rich clusters. Surface‐segregated Si and Cu are observed and Cl and Cu are found in the oxide. Copyright © 2001 John Wiley & Sons, Ltd.
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E. Umbach · TrAC Trends in Analytical Chemistry · 1992 · 2.5K citations
Effects of Alloying Elements in Anodizing of Aluminium
H. Habazaki, Ken‐ichi Shimizu, P. Skeldon et al. · Transactions of the IMF · 1997 · 209 citations
Natural Sciences, Materials Engineering, Materials Science +17