Are Nanophase Grain Boundaries Anomalous?

Abstract

The grain boundary regions of nanophase Cu metal are investigated using the x-ray absorption fine structure (XAFS) technique. Typical samples made by standard techniques need to be greatly thinned if measured in transmission in order to eliminate experimental artifacts which erroneously lower the apparent coordination number. To avoid this problem the samples were measured by the total electron yield technique. The results indicate a grain boundary structure which, on the average, is similar to that in conventional polycrystalline Cu, contrary to previous XAFS measurements made in transmission which indicated a lower coordination number.