ToF‐SIMS Imaging of DBD‐Plasma‐Printed Microspots on BOPP Substrates

Abstract

Abstract Imaging ToF‐SIMS has been applied to characterize the surface chemistry variations across small areas produced by a DBD‐type plasma printing technique on a BOPP substrate using pure nitrogen and a nitrogen‐hydrogen gas mixture. CH 4 N + and CNO − secondary ions are detected with high yields remote from the discharge region. They are discussed to be due to surface modifications of the substrate by metastable gas‐phase species. On the other hand, surface species exist that are preferentially formed by reactions of the substrate with short‐lived species which are only present close to the plasma discharge region. A C 3 H 8 O + secondary fragment ion is assumed to be a key fragment of such a surface species. magnified image