Publication | Closed Access
Self-Consistent Method for Point Defects in Semiconductors: Application to the Vacancy in Silicon
324
Citations
10
References
1978
Year
Point DefectsEngineeringLcao Basis SetSelf-consistent MethodDefect ToleranceElectronic StructureSemiconductor DeviceSemiconductorsNanoelectronicsElectrical EngineeringNeutral Point DefectsPhysicsBias Temperature InstabilityIntrinsic ImpuritySemiconductor MaterialDefect FormationQuantum ChemistryMicroelectronicsIsolated VacancyNatural SciencesApplied PhysicsCondensed Matter Physics
We report the development of a method to calculate self-consistently the electronic structure of neutral point defects in semiconductors. The method is an adaptation of the original Koster-Slater idea. Calculations become feasible, practical, and accurate at the level of current band-structure and surface calculations when an LCAO basis set is used instead of Wannier functions. A detailed study of the isolated vacancy is Si is used to illustrate the method.
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