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In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis

Materials ScienceEngineeringMicromechanicsMechanical PropertiesMechanical BehaviorMechanical EngineeringMicron-sized Silicon PillarsStressstrain AnalysisRaman Microscopy—stress MeasurementsMechanical DeformationMechanics Of MaterialsHigh Strain RateSitu Compression Tests