Structure analysis of the HF-treated Si(111):H surface with medium-energy ion scattering - Concepedia

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Structure analysis of the HF-treated Si(111):H surface with medium-energy ion scattering

11

Citations

19

References

1994

Year

Akira Nishiyama, G. Ter Horst, M. Lohmeier, Alfons M. Molenbroek, J.W.M. Frenken

Surface Science

Surface CharacterizationEngineeringPhysicsSurface ChemistrySurface AnalysisSurface ScienceApplied PhysicsMedium-energy IonHf-treated SiSilicon On InsulatorStructure Analysis

References

	Year	Citations

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