Publication | Closed Access
Improvement in Lasing Characteristics of GaN-based Vertical-Cavity Surface-Emitting Lasers Fabricated Using a GaN Substrate
89
Citations
8
References
2009
Year
Wide-bandgap SemiconductorPhotonicsElectrical EngineeringGan SubstrateEngineeringRf SemiconductorSi SubstratesApplied PhysicsAluminum Gallium NitrideSapphire SubstrateGan Power DeviceLaser-assisted DepositionSurface-emitting LasersMicroelectronicsOptoelectronicsCategoryiii-v Semiconductor
We compared the lasing characteristics of GaN-based vertical-cavity surface-emitting lasers (VCSELs) fabricated using a GaN substrate with those fabricated using a sapphire substrate. The original substrates are removed from the devices after the devices have been bonded to Si substrates. Consequently, with the exception of the cavity length, the two kinds of fabricated VCSELs have almost the same structures. The VCSELs fabricated using a GaN substrate have a higher maximum output power (0.62 mW) and longer lifetimes than those fabricated using a sapphire substrate. Even for the VCSELs fabricated with a GaN substrate, 10-min operation causes their threshold current to increase.
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