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Electric current enhanced defect mobility in Ni3Ti intermetallics
215
Citations
18
References
2004
Year
Wide-bandgap SemiconductorDefect ToleranceElectrical EngineeringPoint DefectsElectron Wind EffectPhysicsEngineeringNanoelectronicsPositron Annihilation SpectroscopyApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialDefect FormationMicroelectronicsCategoryiii-v SemiconductorDefect Mobility
The effect of the application of a dc current on the annealing of point defects in Ni3Ti was investigated by positron annihilation spectroscopy. An increased defect annealing rate was observed under the influence of the current and was attributed to a 24% decrease in the activation energy of mobility. The results are interpreted in terms of the electron wind effect and the complex nature of diffusion in ordered intermetallic phases. They provide direct evidence for an increase in defect mobility in ordered intermetallics under the influence of a current.
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