Publication | Closed Access
Asynchronous balanced gates tolerant to interconnect variability
23
Citations
5
References
2008
Year
Unknown Venue
Hardware SecurityElectrical EngineeringDual-rail Data OutputsEngineeringQuantum ComputingVlsi DesignCapacitance MatchingPower Optimization (Eda)Vlsi ArchitectureComputer ArchitectureComputer EngineeringSide-channel AttackProcess VariabilityMicroelectronicsPower-aware DesignAsynchronous Circuits
Existing methods for gate level power attack countermeasures depend on exact capacitance matching of the dual-rail data outputs of each gate. Process variability and a lack of design tools make this requirement very difficult to satisfy in practice. We present a novel asynchronous dual-rail gate design which is power balanced, does not require capacitance matching of the data outputs, and is tolerant to process variability on the routed interconnect between gates.
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