Applied Physics Letters · 2003 · 38 citations · 26 references
Natural SciencesElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesThin FilmsLuminescent MaterialsOptoelectronic DevicesOptoelectronic MaterialsSemiconductor Device MaterialsSemiconductor Thin FilmsThin-film MaterialsAmorphous CarbonAmorphous SiliconElectroluminescenceElectroluminescent MaterialsHeterojunction DevicesIndium Tin Oxide Thin FilmsLight-emitting DevicesVisible Emissions
White-blue electroluminescent emission with a voltage bias less than 10 V was achieved in rf sputter-deposited amorphous carbon nitride (a-CN) and amorphous silicon carbon nitride (a-SiCN) thin-film-based devices. The heterojunction structures of these devices consist of: Indium tin oxide (ITO), used as a transparent anode; amorphous carbon film as an emission layer, and aluminum as a cathode. The thickness of the carbon films was about 250 Å. In all of the produced diodes, a stable visible emission peaked around 475 nm is observed at room temperature and the emission intensity increases with the current density. For an applied voltage of 14 V, the luminance was about 3 mCd/m2. The electroluminescent properties of the two devices are discussed and compared.
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John Robertson · Materials Science and Engineering R Reports · 2002 · 6.1K citations
The work function of the elements and its periodicity
Herbert B. Michaelson · Journal of Applied Physics · 1977 · 4.2K citations
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