Applied Physics Letters · 2009 · 172 citations · 26 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsOptical MaterialsSemiconductor MaterialsAlloysDopingSemiconductor Device MaterialsSemiconductor PhysicsWide Band Gap SemiconductorsWide-bandgap SemiconductorsChargesConductivityDeep-level ImpuritiesGallium NitrideGallium Nitride (Gan) MaterialsP-type ConductivityPhotoluminescencePhotoluminescence Spectroscopy
Deep ultraviolet photoluminescence spectroscopy was employed to study the impurity transitions in Mg-doped AlGaN alloys. A group of deep level impurity transitions was observed in Mg-doped AlxGa1−xN alloys, which was identified to have the same origin as the previously reported blue line at 2.8eV in Mg-doped GaN and was assigned to the recombination of electrons bound to the nitrogen vacancy with three positive charges (VN3+) and neutral Mg acceptors. Based on the measured activation energies of the Mg acceptors in AlGaN and the observed impurity emission peaks, the VN3+ energy levels in AlxGa1−xN have been deduced for the entire alloy range. It is demonstrated that the presence of high density of VN3+ deep donors translates to the reduced p-type conductivity in AlGaN alloys due to their ability for capturing free holes.
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Nature of the 2.8 eV photoluminescence band in Mg doped GaN
U. Kaufmann, M. Kunzer, Matthias Maier et al. · Applied Physics Letters · 1998 · 355 citations
Mg acceptor level in AlN probed by deep ultraviolet photoluminescence
K. B. Nam, M. L. Nakarmi, J. Li et al. · Applied Physics Letters · 2003 · 311 citations
Natural Sciences, Materials Engineering, Materials Science +15