Publication | Closed Access
Current-voltage measurements as a probe of the activation barriers for flux creep in thin films of YBa2Cu3O7−δ
17
Citations
40
References
1996
Year
Electrical EngineeringHigh-tc SuperconductivityEngineeringFlux CreepApplied PhysicsCondensed Matter PhysicsSuperconductivityHigh Tc SuperconductorsCurrent-voltage MeasurementsThin FilmsThin Film Processing
| Year | Citations | |
|---|---|---|
Page 1
Page 1