Publication | Closed Access
AES study of the low-pressure oxidation of Si(100): Electron beam effects
34
Citations
9
References
1983
Year
Electrical EngineeringIon ImplantationEngineeringElectron Beam EffectsApplied PhysicsLow-pressure OxidationIon BeamAes StudyIon EmissionSilicon On Insulator
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