Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination

Abstract

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring‐8. This was achieved using a microbeam focusing system and the submicrometer precision low‐eccentric goniometer system. We demonstrated the structure analyses with 2×2×2 μm3 cytidine, 600×600×300 nm3 BaTiO3, and 1×1×1 μm3 silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendellösung method and do not require absorption and extinction corrections.