Journal of Materials Science · 1967 · 33 citations · 3 references
Natural SciencesMaterials SciencePhysicsCrystal StructureElectronic MaterialsDefects In Electronic MaterialsDislocation MechanicsDislocation TheoryStrain HardeningDislocation BehaviorDislocation CharacterizationDislocation MotionDislocation Structure AnalysisPhotoelastic Strain Analysis
3
Birefringence Caused by Edge Dislocations in Silicon
R. Bullough · Physical Review · 1958 · 69 citations