Publication | Closed Access
Bismuth segregation enhances intermetallic compound growth in SnBi/Cu microelectronic interconnect
50
Citations
14
References
2010
Year
Materials ScienceElectrical EngineeringWafer Scale ProcessingEngineeringApplied PhysicsSemiconductor MaterialSemiconductor Device FabricationBismuth SegregationMicroelectronicsInterconnect (Integrated Circuits)
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